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Scanning electron microscope
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181	Seeing in th eN a now orl d Add to Reading List Source URL: outreach.materials.ox.ac.uk Language: English - Date: 2007-02-26 06:28:33 Science Microscopes Diffraction Electron beam Electron diffraction Transmission electron microscopy Electron microscope Electron Scanning transmission electron microscopy Scientific method Physics Electron microscopy
182	Engineers devise method for producing high-res, 3D images of nanoscale objects Add to Reading List Source URL: phys.org Language: English - Date: 2015-04-14 14:41:32 Electron microscopy Materials science Electron beam Cathodoluminescence Luminescence Electron microscope Scanning electron microscope Electron Microscope Scientific method Physics Science
183	PRESS RELEASE / PRESSEINFORMATION PRESS RELEASE / PRESSEINFORMATION Press Release Add to Reading List Source URL: www.leica-microsystems.com Language: English - Date: 2015-04-02 03:42:29 Microscopes Electron microscopy Leica Leica Microsystems Microscopy Electron microscope Optical microscope Leica Camera Confocal laser scanning microscopy Scientific method Science Chemistry
184	SCANNING ELECTRON MICROSCOPIC FACILITY CORROSION LABORATORY DEPARTMAENT OF MATERIALS SCIENCE AND ENGG. IIT KANPUR MICROSCOPE USAGE APPLICATION FOR INSTITUE USERS Add to Reading List Source URL: www.iitk.ac.in Language: English - Date: 2015-01-29 02:15:38 Scanning electron microscope Microscope Scientific method Electron microscopy Science
185	Newly Developed Soft X-ray High Energy Resolution Grating Spectrometer Opens Up the Door of Routine Analysis of Li by Electron Microscopes November 25, 2013 Japan Science and Technology Agency (JST) JEOL Ltd. Tohoku Univ Add to Reading List Source URL: www.jeol.co.jp Language: English - Date: 2014-02-14 00:20:00 Spectroscopy X-ray spectroscopy Electron microprobe Electron Scanning electron microscope Monochromator X-ray Emission spectrum Particle-induced X-ray emission Physics Science Scientific method
186	Sample Results Summary Sheet Please return this form to the Curator for each allocated Sample RA-QD02[removed]One among the four original samples for space weathering observation) Sample ID: Add to Reading List Source URL: hayabusaao.isas.jaxa.jp Language: English - Date: 2014-12-15 18:59:02 Electron microscope Scanning electron microscope Transmission electron microscopy Microtome Scanning transmission electron microscopy Microscopy Scientific method Electron microscopy Science
187	Principal New Research Facilities Light Water Reactor Materials Analysis Station (Second Period) Purpose: This analysis station has been equipped in order to reinforce and evolve microstructural analysis techniques of r Add to Reading List Source URL: criepi.denken.or.jp Language: English - Date: 2010-12-28 01:58:38 Focused ion beam Transmission electron microscopy Electron microscope Scanning electron microscope Microscope Characterization Electron Energy-dispersive X-ray spectroscopy Scanning transmission electron microscopy Scientific method Electron microscopy Science
188	WORLD’S BEST Non-Profit org. uS Postage PAID Permit No 504 Lehigh valley, PA Add to Reading List Source URL: www.lehigh.edu Language: English - Date: 2014-10-20 15:53:55 Microscopes Diffraction Scanning electron microscope Spectroscopy EDAX Electron microscope Aspex Focused ion beam Electron diffraction Scientific method Science Electron microscopy
189	FOCUS ON ESSENTIAL RESEARCH TOOLS Electron Microscopy Sciences P.O. Box 550 • 1560 Industry Rd. • Hatfield, Pa[removed]Tel: ([removed] • Fax: ([removed] Add to Reading List Source URL: www.emsdiasum.com Language: English - Date: 2015-03-26 09:00:00 Microscopy Microbiology Microscopes Transmission electron microscopy Electron microscope Scanning electron microscope Sputter coating Cryo-electron microscopy Environmental scanning electron microscope Scientific method Science Electron microscopy
190	NanoTech1401002AgeevILO.fm Add to Reading List Source URL: www.ntmdt.com Language: English - Date: 2015-01-20 05:11:10 Electron microscopy Semiconductor device fabrication Thin film deposition Microtechnology Focused ion beam Ion beam Microelectromechanical systems Scanning electron microscope Nanotechnology Physics Scientific method Science